Low Defect NIR Blocking Filter for Imaging Sensors

Cover Glass for CMOS/CCD Sensors

High performance digital image capture with CMOS or CCD sensors requires efficient blocking of the Near Infrared (NIR) in a broad wavelength range. The edge shape of such a filter depends very much on the application and therefore is custom designed. Furthermore, only a low defect density can be tolerated as every defect may lead to pixel loss. Finally, some high end applications require cover glass apertures to mask sensor framework.

Benefits

• A cutting edge low defect coating technology enables large area cover glasses with no defects larger than 20 µm.
• Broad blocking range, with minimized angle of incidence dependence.
• In house patterning technology permits the custom application of chrome apertures.

Applications

Cover glass for packaging of digital imaging sensors, such as CMOS and CCD sensors.

Technical Data

Transmittance

T_avg > 90% at 430–570 nm

Blocking

T_avg < 1% at 700–1100 nm

Slope

Depending on application

Surface quality

No defects > 20 µm

Chrome reflectivity

R < 18% at visual range

Environmental stability

MIL-C-675B

Size limits

100 ⋅ 100 mm